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Sumida, Kazuki*; Kakoki, Masaaki*; Reimann, J.*; Nurmamat, M.*; Goto, Shinichi*; Takeda, Yukiharu; Saito, Yuji; Kokh, K. A.*; Tereshchenko, O. E.*; Gdde, J.*; et al.
New Journal of Physics (Internet), 21(9), p.093006_1 - 093006_8, 2019/09
Times Cited Count:11 Percentile:64.45(Physics, Multidisciplinary)Lee, H. S.*; Yamaguchi, Masafumi*; Ekins-Daukes, N. J.*; Khan, A.*; Takamoto, Tatsuya*; Imaizumi, Mitsuru*; Oshima, Takeshi; Ito, Hisayoshi
Physica B; Condensed Matter, 376-377, p.564 - 567, 2006/04
Times Cited Count:2 Percentile:12.56(Physics, Condensed Matter)no abstracts in English
Laird, J. S.; Hirao, Toshio; Onoda, Shinobu; Ito, Hisayoshi
Journal of Applied Physics, 98(1), p.013530_1 - 013530_14, 2005/07
Times Cited Count:45 Percentile:80.53(Physics, Applied)no abstracts in English
Lee, H. S.*; Ekins-Daukes, N. J.*; Sasaki, Takuo*; Yamaguchi, Masafumi*; Khan, A.*; Takamoto, Tatsuya*; Agui, Takaaki*; Kamimura, Kunio*; Kaneiwa, Minoru*; Imaizumi, Mitsuru*; et al.
Proceedings of 31st IEEE Photovoltaic Specialists Conference and Exhibition (PVSC-31), p.556 - 558, 2005/00
no abstracts in English
Iwata, Hiroshi*; Kagamihara, Satoshi*; Matsuura, Hideharu*; Kawakita, Shiro*; Oshima, Takeshi; Kamiya, Tomihiro
Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.143 - 146, 2004/10
no abstracts in English
Ekins-Daukes, N. J.*; Lee, H. S.*; Sasaki, Takuo*; Yamaguchi, Masafumi*; Khan, A.*; Takamoto, Tatsuya*; Agui, Takaaki*; Kamimura, Kunio*; Kaneiwa, Minoru*; Imaizumi, Mitsuru*; et al.
Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.87 - 91, 2004/10
no abstracts in English
Ekins-Daukes, N. J.*; Lee, H. S.*; Sasaki, Takuo*; Yamaguchi, Masafumi*; Khan, A.*; Takamoto, Tatsuya*; Agui, Takaaki*; Kamimura, Kunio*; Kaneiwa, Minoru*; Imaizumi, Mitsuru*; et al.
Applied Physics Letters, 85(13), p.2511 - 2513, 2004/09
Times Cited Count:11 Percentile:42.73(Physics, Applied)no abstracts in English
Lee, H.-S.*; Okada, Hiroshi*; Wakahara, Akihiro*; Yoshida, Akira*; Oshima, Takeshi; Ito, Hisayoshi; Kawakita, Shiro*; Imaizumi, Mitsuru*; Matsuda, Sumio*
Physica Status Solidi (A), 199(3), p.471 - 474, 2003/10
Times Cited Count:3 Percentile:21.31(Materials Science, Multidisciplinary)no abstracts in English
Lee, H.-S.*; Okada, Hiroshi*; Wakahara, Akihiro*; Oshima, Takeshi; Ito, Hisayoshi; Kawakita, Shiro*; Imaizumi, Mitsuru*; Matsuda, Sumio*; Yoshida, Akira*
Journal of Physics and Chemistry of Solids, 64(9-10), p.1887 - 1890, 2003/09
Times Cited Count:12 Percentile:53.83(Chemistry, Multidisciplinary)no abstracts in English
Tanzawa, Sadamitsu; Hiroki, Seiji; Abe, Tetsuya
Shinku, 46(3), p.154 - 157, 2003/03
no abstracts in English
Dharmarasu, N.*; Yamaguchi, Masafumi*; Bourgoin, J. C.*; Takamoto, Tatsuya*; Oshima, Takeshi; Ito, Hisayoshi; Imaizumi, Mitsuru*; Matsuda, Sumio*
Applied Physics Letters, 81(1), p.64 - 66, 2002/07
Times Cited Count:17 Percentile:55.81(Physics, Applied)We studied the properties of observed defects in n/p-InGaP solar cells created by irradiation of protons with different energies.Three majority (hole) and a minority-carrier traps, labeled respectively as HP1 (E+0.900.05eV), HP2 (E+0.730.05eV), H2 (E +0.55eV),and EP1 (E 0.54eV),were identified using deep level transient spectroscopy. All majority-carrier traps were found to act as recombination centers. While the H2 traps present in the proton-irradiated p-InGaP was found to anneal out by minority-carrier injection, the other traps were not.
Fujita, Naoki*; Lee, H.-S.*; Okada, Hiroshi*; Wakahara, Akihiro*; Yoshida, Akira*; Oshima, Takeshi; Ito, Hisayoshi
Shingaku Giho, 102(77), p.79 - 84, 2002/05
no abstracts in English
Dharmarasu, N.*; Khan, A.*; Yamaguchi, Masafumi*; Takamoto, Tatsuya*; Oshima, Takeshi; Ito, Hisayoshi; Imaizumi, Mitsuru*; Matsuda, Sumio*
Journal of Applied Physics, 91(5), p.3306 - 3311, 2002/03
Times Cited Count:25 Percentile:66.93(Physics, Applied)3MeV proton irradiation effects on InGaP single junction and InGaP/GaAs two junction cells were studied. The degradation of electrocal properties for InGaP cells was smaller than that for InGaP/GaAs cells. The results of the measurement of spectral response showed the large degradation in long wavelength. This indicates that GaAs cell degrades. The Damage coefficient of minority carrier diffusion length was estimated to be 7.910 for InGaP and 1.610 for GaAs. These values of the damage coefficient for InGaP and GaAs are 580 times and 280 times larger than those for InGaP and GaAs irradiated with 1MeV electrons.
Dharmarasu, N.*; Yamaguchi, Masafumi*; Khan, K.*; Takamoto, Tatsuya*; Oshima, Takeshi; Ito, Hisayoshi; Imaizumi, Mitsuru*; Matsuda, Sumio*
Physica B; Condensed Matter, 308-310, p.1181 - 1184, 2001/12
Times Cited Count:7 Percentile:41.34(Physics, Condensed Matter)Carrier concentration and defects in n+/p InGaP irradiated with 100keV-protons (1E10, 5E12 /cm2) were studied.As a result of C-V measurements, the carrier removal rate was estimated to be 6.1E4 /cm2 which was extremely high as compared to 1MeV-electron irradiation case (0.93 /cm). H1 peak whose energy corresponds to Ev+0.90V was obtained from DLTS measurements. This suggests that carrier removal rate in proton-irradiated ones is much higher than that in electron-irradiated ones due to the generation of the defects (H1 peak) which act as majority carrier traps.
Dharmarasu, N.*; Yamaguchi, Masafumi*; Khan, A.*; Yamada, Takashi*; Tanabe, Tatsuya*; Takagishi, Shigenori*; Takamoto, Tatsuya*; Oshima, Takeshi; Ito, Hisayoshi; Imaizumi, Mitsuru*; et al.
Applied Physics Letters, 79(15), p.2399 - 2401, 2001/10
Times Cited Count:75 Percentile:90.91(Physics, Applied)The radiation response of 3MeV proton-irradiated InGaP, InGaAsP, and InGaAs solar cells was measured and analyzed in comparison with those of InP and GaAs. The degradation of the minority-carrier diffusion length was estimated from the spectral response. The damage coefficient K for 3MeV proton-irradiated InGaP, InGaAsP and InGaAs was also determined. The radiation resistance increases with increase in the function of In-P bonds in those materials. Minority-carrier injection under forward bias is found to cause partial recovery of the degradation on irradiated InGaP and InGaAsP cells.
Tanzawa, Sadamitsu; Hiroki, Seiji; Abe, Tetsuya; Inohara, Takashi*
Shinku, 44(7), p.667 - 670, 2001/07
no abstracts in English
Oshima, Takeshi; Abe, Koji*; Ito, Hisayoshi; Yoshikawa, Masahito; Kojima, Kazutoshi; Nashiyama, Isamu*; Okada, Sohei
Applied Physics A, 71(2), p.141 - 145, 2000/10
no abstracts in English
Sugai, Hiroyuki
JAERI-Research 99-041, 164 Pages, 1999/07
no abstracts in English
Osakabe, Toyotaka; *; Iwasa, Kazuaki*; Kakurai, Kazuhisa*; J.-M.Mignot*; I.Goncharenko*; *; Takahashi, Hiroki*; Mori, Nobuo*; Kubota, M.*; et al.
Physics of Strongly Correlated Electron Systems (JJAP Series 11), p.123 - 125, 1998/00
no abstracts in English
Oshima, Takeshi; Morita, Yosuke; Nashiyama, Isamu; Kawasaki, Osamu*; Hisamatsu, Tadashi*; Matsuda, Sumio*; Nakao, Tetsuya*; Wako, Yoshihito*
JAERI-Conf 97-003, p.256 - 260, 1997/03
no abstracts in English